Fully-automated system enabling measurement of a 2D surface
Automatically adjusts the focus with a 20 times larger depth of field compared to the conventional microscope
HD (High-Definition) capturing makes it possible to observe the roughest and most uneven surfaces (surfaces which were impossible to view before)
Measures everything from 3D Contours to surface roughness in 3D
Get Certified by KEYENCE!
Click "Continue" and then "Download" to be eligible for the quiz participation and certificate.
If you have registered in the past, please enter your registered email address below.If you are not yet registered, please enter your email address below and click "Continue" to complete your registration.
We guarantee 100% privacy – your information will never be shared.
Online Member Benefits
Forgot Your Password?
Sign in to a different account
We could not find an existing KEYENCE site account with the email address you entered. Please complete the registration form below in order to proceed. You will not need to complete this form again in the future.
Or sign in with a different email address.